• DocumentCode
    321724
  • Title

    IEE Colloquium Materials Characterisation - How Can We Do It? How Can It Tell Us? (Ref. No.1997/150)

  • fYear
    1997
  • fDate
    35768
  • Abstract
    The following topics were dealt with: IR spectroscopy and related techniques; surface chemical characterisation; electron microscopy and polymers; materials design through structural control; time-dependent properties; mechanical characterisation of ceramics; chemical sensor analysis; X-ray induced partial discharge for HV insulation diagnostics; electrical damage simulation
  • Keywords
    materials properties; HV insulation diagnostics; IR spectroscopy; X-ray induced partial discharge; ceramics; chemical sensor analysis; electrical damage simulation; electron microscopy; materials characterisation; materials design; mechanical characterisation; polymers; structural control; surface chemical characterisation; time-dependent properties;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Materials Characterisation - How Can We Do It? What Can It Tell Us? (Ref. No: 1997/150), IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    659993