DocumentCode :
321724
Title :
IEE Colloquium Materials Characterisation - How Can We Do It? How Can It Tell Us? (Ref. No.1997/150)
fYear :
1997
fDate :
35768
Abstract :
The following topics were dealt with: IR spectroscopy and related techniques; surface chemical characterisation; electron microscopy and polymers; materials design through structural control; time-dependent properties; mechanical characterisation of ceramics; chemical sensor analysis; X-ray induced partial discharge for HV insulation diagnostics; electrical damage simulation
Keywords :
materials properties; HV insulation diagnostics; IR spectroscopy; X-ray induced partial discharge; ceramics; chemical sensor analysis; electrical damage simulation; electron microscopy; materials characterisation; materials design; mechanical characterisation; polymers; structural control; surface chemical characterisation; time-dependent properties;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Materials Characterisation - How Can We Do It? What Can It Tell Us? (Ref. No: 1997/150), IEE Colloquium on
Conference_Location :
London
Type :
conf
Filename :
659993
Link To Document :
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