• DocumentCode
    3217364
  • Title

    The effect of the morphology on the field emission characteristics of the well-aligned carbon nanotubes synthesized in methanol

  • Author

    Gamo, H. ; Kurihara, Hiroshi ; Ando, Takehiro ; Gamo, M.N.

  • Author_Institution
    Tech. Res. Inst., Toppan Printing Co., Ltd., Saitama, Japan
  • fYear
    2010
  • fDate
    14-16 Oct. 2010
  • Firstpage
    477
  • Lastpage
    478
  • Abstract
    In this study, the field electron emission from the vertically well-aligned CNTs catalytically synthesized in liquid methanol was measured to determine the relation between the emission properties and their morphologies. Heavily doped n-type silicon (Si) wafers with a low resistivity less than 0.02 Ω cm were used as a substrate for the CNT growth. The morphology and fine structure of the grown CNTs were observed by scanning electron microscopy (SEM).
  • Keywords
    carbon nanotubes; electron field emission; nanofabrication; scanning electron microscopy; surface morphology; C; CNT growth; Si; electrical resistivity; field electron emission; fine structure; heavily doped n-type silicon wafers; liquid methanol; scanning electron microscopy; well-aligned carbon nanotube synthesis; Cooling; Glass; Phosphors; Silicon; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-6645-0
  • Type

    conf

  • DOI
    10.1109/IVESC.2010.5644255
  • Filename
    5644255