DocumentCode
3217364
Title
The effect of the morphology on the field emission characteristics of the well-aligned carbon nanotubes synthesized in methanol
Author
Gamo, H. ; Kurihara, Hiroshi ; Ando, Takehiro ; Gamo, M.N.
Author_Institution
Tech. Res. Inst., Toppan Printing Co., Ltd., Saitama, Japan
fYear
2010
fDate
14-16 Oct. 2010
Firstpage
477
Lastpage
478
Abstract
In this study, the field electron emission from the vertically well-aligned CNTs catalytically synthesized in liquid methanol was measured to determine the relation between the emission properties and their morphologies. Heavily doped n-type silicon (Si) wafers with a low resistivity less than 0.02 Ω cm were used as a substrate for the CNT growth. The morphology and fine structure of the grown CNTs were observed by scanning electron microscopy (SEM).
Keywords
carbon nanotubes; electron field emission; nanofabrication; scanning electron microscopy; surface morphology; C; CNT growth; Si; electrical resistivity; field electron emission; fine structure; heavily doped n-type silicon wafers; liquid methanol; scanning electron microscopy; well-aligned carbon nanotube synthesis; Cooling; Glass; Phosphors; Silicon; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location
Nanjing
Print_ISBN
978-1-4244-6645-0
Type
conf
DOI
10.1109/IVESC.2010.5644255
Filename
5644255
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