Title :
The effect of the morphology on the field emission characteristics of the well-aligned carbon nanotubes synthesized in methanol
Author :
Gamo, H. ; Kurihara, Hiroshi ; Ando, Takehiro ; Gamo, M.N.
Author_Institution :
Tech. Res. Inst., Toppan Printing Co., Ltd., Saitama, Japan
Abstract :
In this study, the field electron emission from the vertically well-aligned CNTs catalytically synthesized in liquid methanol was measured to determine the relation between the emission properties and their morphologies. Heavily doped n-type silicon (Si) wafers with a low resistivity less than 0.02 Ω cm were used as a substrate for the CNT growth. The morphology and fine structure of the grown CNTs were observed by scanning electron microscopy (SEM).
Keywords :
carbon nanotubes; electron field emission; nanofabrication; scanning electron microscopy; surface morphology; C; CNT growth; Si; electrical resistivity; field electron emission; fine structure; heavily doped n-type silicon wafers; liquid methanol; scanning electron microscopy; well-aligned carbon nanotube synthesis; Cooling; Glass; Phosphors; Silicon; Substrates;
Conference_Titel :
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-6645-0
DOI :
10.1109/IVESC.2010.5644255