DocumentCode :
3217386
Title :
Developing MESA: An accelerated reliability test
Author :
Baskoro, Gembong ; Rouvroye, Jan L. ; Bacher, Willibald ; Brombacher, Aarnout C.
Author_Institution :
Eindhoven Univ. of Technol., Netherlands
fYear :
2003
fDate :
2003
Firstpage :
303
Lastpage :
308
Abstract :
This paper describes the on-going research on an accelerated reliability test strategy called MESA (Multiple Environment Stress Analysis) intended to find in a fast and efficient manner (potential) reliability problems during the design phase of high volume consumer products. This test has shown promising results on its capability to provoke failures, especially on failures formerly registered as NFF (no-fault-found). The strategy applies combinations of stressors in a statistically efficient test scheme. To validate results, MESA must be able to reproduce failures with similar stressor configurations and test scheme. First pilot tests have been completed. The results show that it is possible to induce realistic, previously unknown, field failure´s in an efficient manner during the design stage. Considering that this test was the first pilot on the development of MESA, many opportunities are still left to be further explored.
Keywords :
failure analysis; life testing; reliability; MESA; accelerated reliability test; multiple environment stress analysis; new product development; no-fault-found; reliability problems; stressor configurations; Consumer electronics; Consumer products; Failure analysis; Life estimation; Manufacturing; Process design; Product development; Stress; Testing; US Department of Energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2003. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-7717-6
Type :
conf
DOI :
10.1109/RAMS.2003.1181959
Filename :
1181959
Link To Document :
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