• DocumentCode
    3217430
  • Title

    Touschek Lifetime and Undulator Damage in the Advanced Photon Source

  • Author

    Borland, M. ; Emery, L.

  • Author_Institution
    ANL, Argonne, IL 60439, USA; borland@aps.anl.gov
  • fYear
    2005
  • fDate
    16-20 May 2005
  • Firstpage
    3835
  • Lastpage
    3837
  • Abstract
    The Advanced Photon Source (APS) has two insertion devices (IDs) with small-aperture vacuum chambers. The full vertical aperture in these chambers is 5 mm, while the inboard horizontal aperture is 15 mm. These devices suffer significant radiation damage, requiring frequent retuning. We recently hypothesized that the damage resulted from loss of Touschek-scattered particles on the horizontal aperture of the chambers. This results partly from the small size of the aperture and partly from the pattern of the dispersion and beta functions in the low-emittance APS lattice. The horizontal scrapers are located near the middle of the arcs where the dispersion was high in the original lattice, but now, in the low-emittance lattice, the dispersion there is much reduced. Similarly, the dispersion at the IDs was originally zero but is now close to the maximum for the lattice. In this paper, we summarize simulations and experiments that support our hypothesis and discuss remedies.
  • Keywords
    Apertures; Electrons; Intrusion detection; Lattices; Particle beam injection; Particle scattering; Storage rings; Synchrotron radiation; Undulators; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 2005. PAC 2005. Proceedings of the
  • Print_ISBN
    0-7803-8859-3
  • Type

    conf

  • DOI
    10.1109/PAC.2005.1591640
  • Filename
    1591640