Title :
A Sealed Liquid Cell for In Situ Transmission Electron Microscopy of Controlled Electrochemical Processes
Author :
Leenheer, Andrew J. ; Sullivan, John P. ; Shaw, Michael J. ; Harris, C. Thomas
Author_Institution :
Center for Integrated Nanotechnol., Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
A microfabricated liquid cell that permits imaging and controlling of electrochemical processes in a transmission electron microscope (TEM) has been developed, and its capabilities are demonstrated. The liquid cell comprises two silicon chips with suspended electron-transparent silicon nitride membranes that encapsulate and hermetically seal a thin (~100 nm) liquid layer in the TEM high-vacuum environment. Up to 10 integrated electrodes with selectively exposed areas allow multiple experiments to be performed on the same chip, and the electrode geometry has been designed to facilitate the assembly of nanostructures or nanoscale patterning of thin-film materials on the electrodes. We demonstrate the cell operation by picoampere-level electrochemical control and imaging of copper electrodeposition. A wide variety of materials and electrolytes may be studied with this cell design, and the relatively small (~1 μm2) exposed electrode areas enable quantitative electrochemical control at low currents.
Keywords :
electrochemical electrodes; electrochemistry; electrodeposition; electrolytes; membranes; nanopatterning; nanostructured materials; transmission electron microscopy; TEM high-vacuum environment; controlled electrochemical processes; copper; electrodeposition; electrolytes; in situ transmission electron microscopy; integrated electrodes; microfabrication; nanoscale patterning; nanostructures; picoampere-level electrochemical control; quantitative electrochemical control; sealed liquid cell; suspended electron-transparent silicon nitride membranes; thin-film materials; Assembly; Electrodes; Geometry; Liquids; Metals; Seals; Batteries; electrochemical devices; electrochemical processes; imaging; materials science and technology; materials science and technology.; microscopy;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2014.2380771