• DocumentCode
    321808
  • Title

    Integrating software development technology and management: Cleanroom software engineering and the CMM for software

  • Author

    Linger, Richard C. ; Trammell, Carmen J.

  • Author_Institution
    Software Eng. Inst., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    3
  • fYear
    1997
  • fDate
    7-10 Jan 1997
  • Firstpage
    188
  • Abstract
    The Software Engineering Institute´s (SEI) Capability Maturity Model for software (CMM) provides a well defined paradigm for software process improvement. Cleanroom software engineering provides well defined theoretical foundations and practices for software specification, development, testing and certification. The principal focus of the CMM is on management and organization. The principal focus of Cleanroom is on the technology and engineering discipline. The SEI has completed a study that maps Cleanroom into the CMM. The mapping shows that Cleanroom and the CMM are fully compatible, and that the technical practices of Cleanroom can be effectively integrated into the management practices of the CMM. The engineering discipline embodied in Cleanroom provides a firm foundation for project management, as illustrated in a software testing example
  • Keywords
    certification; formal specification; program testing; project management; software development management; CMM; Capability Maturity Model; Cleanroom software engineering; Software Engineering Institute; certification; project management; software development management; software development technology; software process improvement; software specification; software testing; Coordinate measuring machines; Engineering management; Management training; Programming; Project management; Quality management; Software development management; Software engineering; Software quality; Technology management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System Sciences, 1997, Proceedings of the Thirtieth Hawaii International Conference on
  • Conference_Location
    Wailea, HI
  • ISSN
    1060-3425
  • Print_ISBN
    0-8186-7743-0
  • Type

    conf

  • DOI
    10.1109/HICSS.1997.661592
  • Filename
    661592