• DocumentCode
    3218119
  • Title

    Effect of changing the MCP´s bias angle on resolution of image intensifier

  • Author

    Wang, Yannan ; Yang, G.W. ; Chang, B.K.

  • Author_Institution
    Inst. of Electron. Eng. & Optoelectron. Technol., Nanjing Univ. of Sci. & Technol., Nanjing, China
  • fYear
    2010
  • fDate
    14-16 Oct. 2010
  • Firstpage
    244
  • Lastpage
    246
  • Abstract
    This paper studies the impact of MCP´s bias angle on the resolution of image intensifier. To analyze this we obtain the mathematical expression of voltage at every point by resolving the Laplace equation with the finite difference method. Then, we substitute values to the mathematical expression and calculate the voltage in discrete points until the error less than a certain value with the over-relaxation method. Secondly, with the voltage distribution, we compute the distribution of equipotential lines with the trajectory tracing method and calculate the electron trajectories by Hechtel method. Finally, the line spread function is calculated from the placement distribution on the phosphor of the electron trajectories. Then the MTF at the different spatial frequency on the phosphor is gained by the line spread function for Fourier transform.
  • Keywords
    Fourier transform optics; Laplace equations; finite difference methods; microchannel plates; optical resolving power; optical transfer function; Fourier transform; Hechtel method; Laplace equation; finite difference method; image intensifier; line spread function; microchannel plate; modulation transfer function; optical resolution; over-relaxation method; trajectory tracing method; Image resolution; Optical reflection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-6645-0
  • Type

    conf

  • DOI
    10.1109/IVESC.2010.5644295
  • Filename
    5644295