Title :
Understanding the influence of vacancies diffusion in utilizing the Kirkendall phenomenon for nanotubes formation
Author :
Ren, Yi ; Chim, W.K. ; Chiam, S.Y.
Author_Institution :
NUS Grad. Sch. for Integrative Sci. & Eng., Singapore, Singapore
Abstract :
In this work, vacancies diffusion length scale or the size of the nanostructures involved during oxidation when utilizing the Kirkendall phenomenon is presented. Ni nanowires with different diameters are formed by electrodeposition of Ni into anodic aluminium oxide (AAO) membrane. The oxidation of the dispersed Ni nanowires is carried out either via rapid thermal oxidation (RTO) or conventional furnace annealing over a temperature range from 350°C to 850°C in oxygen ambient. Then the NiO nanostructures formed are examined by scanning electron microscopy (SEM), transmission electron microscopy (TEM) and X-ray diffraction (XRD).
Keywords :
X-ray diffraction; chemical interdiffusion; electrodeposition; furnaces; nanofabrication; nanowires; nickel compounds; rapid thermal annealing; scanning electron microscopy; transmission electron microscopy; vacancies (crystal); Kirkendall phenomenon; NiO; SEM; TEM; X-ray diffraction; XRD; anodic aluminium oxide membrane; electrodeposition; furnace annealing; nanotube formation; nickel nanowires; nickel oxide nanostructures; oxidation; rapid thermal oxidation; scanning electron microscopy; temperature 350 degC to 850 degC; transmission electron microscopy; vacancies diffusion;
Conference_Titel :
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-6645-0
DOI :
10.1109/IVESC.2010.5644304
