• DocumentCode
    3218304
  • Title

    Overview of self-magnetic pinch diode investigations on RITS-6

  • Author

    Hahn, K. ; Oliver, B.V. ; Cordova, S.R. ; Leckbee, J.J. ; Molina, I. ; Johnston, M.D. ; Webb, T. ; Rose, D.V. ; Welch, D.R. ; Portillo, S. ; Ziska, D. ; Clough, S. ; Critchley, A. ; Crotch, I. ; Heathcoat, A. ; Jones, Andrew ; Threadgold, J.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    2009
  • fDate
    1-5 June 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. The self-magnetic pinch diode is currently fielded on the RITS-6 accelerator at Sandia National Laboratories operating between 7-12 MV and is the leading candidate for future radiographic source development at the Atomic Weapons Establishment. The diode is capable of producing sub 3-mm radiation spot sizes and greater than 350 Rads measured at lm. Complex physical processes affect the diode operation which in turn may affect its radiographic potential. High-resolution, time-resolved diagnostics have been utilized to help quantify the diode physics which include plasma spectroscopy, gated imaging, X-ray p-i-n diodes, spot size, and diode current measurements. The data from these diagnostics are also used to benchmark particle-in-cell simulations in order to better understand the underlying physics of operation. An overview of these experiments and simulations including future plans is presented.
  • Keywords
    pinch effect; plasma diagnostics; plasma diodes; plasma simulation; RITS-6 accelerator; X-ray P-I-N diodes; diode current measurements; gated imaging; high-resolution time-resolved diagnostics; particle-in-cell simulations; plasma spectroscopy; radiographic potential; self-magnetic pinch diode; spot size; Atomic measurements; Diagnostic radiography; Laboratories; P-i-n diodes; Physics; Plasma diagnostics; Plasma measurements; Plasma simulation; Size measurement; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science - Abstracts, 2009. ICOPS 2009. IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-2617-1
  • Type

    conf

  • DOI
    10.1109/PLASMA.2009.5227635
  • Filename
    5227635