Title :
Design Study of A New Beam Separator for PEEM3
Author :
Wan, W. ; Feng, J. ; Padmore, H.A.
Author_Institution :
LBNL Berkeley, CA 94720, USA
Abstract :
Aberration correction of photoemission electron microscopes (PEEM) requires use of a magnetic beam separator. This device is a complex integrated magnetic system and is essentially fixed in its optical properties hence very susceptible to problems caused by mechanical or magnetic imperfections. Here we present a separate function design that is simple to construct, is fully adjustable and gives outstanding performance.
Keywords :
Electron beams; Electron microscopy; Electron optics; Integrated optics; Magnetic devices; Magnetic force microscopy; Magnetic separation; Particle separators; Photoelectricity; Photoelectron microscopy;
Conference_Titel :
Particle Accelerator Conference, 2005. PAC 2005. Proceedings of the
Print_ISBN :
0-7803-8859-3
DOI :
10.1109/PAC.2005.1591691
