Title :
A practical approach to system reliability growth modeling and improvement
Author :
Yadav, Om P. ; Singh, Nanua ; Goel, Parveen S.
Author_Institution :
Dept. of Ind. & Manuf. Eng., Wayne State Univ., Detroit, MI, USA
Abstract :
In a product development process, to develop appropriate design validation and verification program for reliability assessment, one has to understand the functional behavior of the system, role of components in achieving required functions and failure modes if component/sub-system fails to perform required function. In this paper, the authors propose a simple and practical two-stage approach of system reliability growth modeling considering components, functions, and failure modes. The consideration of these three dimensions will help in uncovering the weak spots in design responsible for low system reliability. The proposed method assumes Weibull distribution as failure time distribution and reliability model is based on the Bayesian framework incorporating even fuzzy information. The fuzzy logic model that has been developed for this purpose is used to quantify the engineering judgment or fuzzy information of reliability improvement attributed to design changes or corrective actions. Uncertainty in data/information at component levels propagates to system level reliability and makes system reliability prediction highly unreliable. The paper suggests a variance reduction strategy to give more accurate system reliability predictions.
Keywords :
Weibull distribution; failure analysis; fuzzy logic; product development; reliability; Bayesian framework; Weibull distribution; components; design validation; design verification; engineering judgment; even fuzzy information; failure modes; failure time distribution; functions; fuzzy logic model; product development process; reliability assessment; reliability improvement; reliability prediction; system reliability growth improvement; system reliability growth modeling; variance reduction strategy; Automotive engineering; Bayesian methods; Design engineering; Failure analysis; Fuzzy logic; Manufacturing industries; Product development; Reliability engineering; System testing; Weibull distribution;
Conference_Titel :
Reliability and Maintainability Symposium, 2003. Annual
Print_ISBN :
0-7803-7717-6
DOI :
10.1109/RAMS.2003.1182014