DocumentCode
3218762
Title
Comparative Study of uniform-doping and gradient-doping NEA GaN photocathodes
Author
Biao Li ; Benkang Chang ; Xiaoqian Fu ; Yujie Du ; Xiaohui Wang ; Xiaoqing Du
Author_Institution
Inst. of Electron. Eng. & Optoletronic Technol., Nanjing Univ. of Sci. & Technol., Nanjing, China
fYear
2010
fDate
14-16 Oct. 2010
Firstpage
217
Lastpage
218
Abstract
High temperature annealing and Cs, O activation is the formations of NEA GaN photocathode of external incentives, GaN material performance of the cathode of the internal factors are fundamental. In this paper, aiming at the difference of the uniform-doping and gradient-doping NEA GaN photocathode in structure, combined with the cathode active changes of the optical current and activated after the success of the spectral characteristics of the uniform-doping and gradient-doping performance of NEA photocathode similarities and differences. Experiments show that: compared to the uniform-doping cathode, graded-doping cathode activated with radiation in the current slow growth rate, activation time is relatively long, successful activation of higher quantum efficiency. Using field-assisted photocathode emission model can explain the differences existing between the two, built-in electric field gradient doping structure to increase the presence of electronic drift to the cathode surface movement; the electron reaches the cathode surface to improve the escape probability of electronic.
Keywords
III-V semiconductors; annealing; doping profiles; gallium compounds; optical properties; photocathodes; photoemission; semiconductor doping; wide band gap semiconductors; GaN; GaN material; activation time; built-in electric field gradient doping structure; cathode active changes; cathode surface movement; current slow growth rate; electronic drift; field-assisted photocathode emission model; gradient doping NEA GaN photocathodes; high temperature annealing; optical current; quantum efficiency; spectral characteristics; uniform doping NEA GaN photocathodes; Cathodes; Gallium nitride;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location
Nanjing
Print_ISBN
978-1-4244-6645-0
Type
conf
DOI
10.1109/IVESC.2010.5644326
Filename
5644326
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