DocumentCode :
3219063
Title :
Physics and modeling of electron emission and injection from low current to high current regime
Author :
Ang, L.K.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ. (NTU), Singapore, Singapore
fYear :
2010
fDate :
14-16 Oct. 2010
Firstpage :
109
Lastpage :
109
Abstract :
In this talk, we will present our works in studying the physics of electron emission from cathodes in some new operating regimes: quantum and ultrafast CL law, non-equilibrium model of ultrafast laser excited photon-field emission, quantum shot noise of field emission from sharp emitters. The results cover a wide range of parameters from low current injection limited regime known as Fowler-Nordheim (FN) law to high current space charge limited (SCL) regime known as Child-Langmuir (CL) law. Some insights related the SCL electron flow in free space and solids will also be discussed. The respectively voltage scaling of V3/2 and V2 in CL law and MG law are well-known and important in many areas such as high current cathode (CL law), and organic electronics (MG law). A new scaling between V3/2 and V2 (a combination of CL law and MG law) will be discussed for a system where both CL and MG law become important. The talk is focused on theory and modeling, but some related experimental works will also be discussed briefly. Some novel applications using electron beam will be discussed.
Keywords :
cathodes; electron field emission; shot noise; space charge; Child-Langmuir law; Fowler-Nordheim law; cathodes; electron emission; electron flow; electron injection; high current space charge; low current; organic electronics; quantum shot noise; sharp emitters; ultrafast laser excited photon-field emission; voltage scaling; Educational institutions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-6645-0
Type :
conf
DOI :
10.1109/IVESC.2010.5644340
Filename :
5644340
Link To Document :
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