DocumentCode
321919
Title
Accelerated testing for extended service AMTEC cells
Author
Svedberg, Robert C. ; Schaupner, Daniel A. ; Appleby, A. John
Author_Institution
Adv. Modular Power Syst. Inc., Ann Arbor, MI, USA
fYear
1997
fDate
27 Jul-1 Aug 1997
Firstpage
1230
Abstract
AMTEC cells are built with readily available materials, β´´-alumina, stainless steel, Mo, Ta, TiCuNi and TiNi brazes, and TiN electrodes. The long term cell performance is dependent on the stability and inertness of these materials in the high temperature Na environment. The task of selecting materials and verifying that they will perform for long times (15 years for a deep space probe) is addressed. Accelerated testing methods and models to utilize the accelerated test data are being developed. A six and twelve month accelerated test plan to evaluate the BASE/Braze/Electrode/Current Collector (BASE Assembly) interfaces in Na vapor at 1200, 1100, and 1000 K is described. An accelerated wick testing program is also discussed. The as-built BASE assembly braze interfaces have been evaluated. TiN electrodes, exposed for about 4000 hours at 1073 K are examined. This information illustrates the direction being taken for evaluating life test results and developing models for life predictions
Keywords
brazing; electrochemical electrodes; life testing; nickel alloys; thermoelectric conversion; thermoelectric devices; titanium alloys; β´´-alumina braze; 1000 to 1200 K; 4000 h; BASE/Braze/Electrode/Current Collector interfaces; Mo braze; Na; Ta braze; TiCuNi braze; TiN; TiN electrodes; TiNi braze; accelerated testing; accelerated wick testing program; deep space probe; extended service AMTEC cells; life prediction models; long term cell performance; stability; stainless steel braze; Assembly; Building materials; Electrodes; Life estimation; Probes; Stability; Steel; Temperature dependence; Testing; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Energy Conversion Engineering Conference, 1997. IECEC-97., Proceedings of the 32nd Intersociety
Conference_Location
Honolulu, HI
Print_ISBN
0-7803-4515-0
Type
conf
DOI
10.1109/IECEC.1997.661944
Filename
661944
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