DocumentCode
3219902
Title
Improving die attach adhesion on metal leadframes via episulfide chemistry
Author
Liu, Yayun ; Zhang, Ruzhi ; Zhang, Yimin ; Xiao, Allison ; Musa, Osama M. ; Tan, Panchivy ; Wang, Renyi
Author_Institution
Nat. Starch & Chem. Co., Bridgewater, NJ, USA
fYear
2005
fDate
16-18 March 2005
Firstpage
70
Lastpage
74
Abstract
The objective of this study is to develop a basic understanding and practical approaches to achieve universal adhesion in metal leadframe packages. Universal die attach refers to a single die attach material that has excellent adhesion properties to Cu, Ag and Ni-Pd-Au substrates. Universal adhesion is a key element in achieving "universal die attach", which means that one single die attach can be applied onto different substrates (Cu, Ag and Ni-Pd-Au), all of which are commonly used in metal leadframe packages in semiconductor industry. The most difficult part of achieving universal adhesion is to achieve a good adhesion on Ag and Ni-Pd-Au by conventional adhesion promoters. In this study, a series of episulfide materials were synthesized, where episulfide moieties can be utilized as a latent thiol generator and can be cured in a similar way as epoxides. The adhesion properties of these materials were investigated through formulation testing, dynamic curing studies, surface analysis and fundamental characterization. We found episulfide indeed functioned as an adhesion promoter and improved cohesiveness of die attach adhesive on Ag and Ni-Pd-Au leadframes. The interactions between episulfide and the host resin system, and the stronger interfacial adhesion to metal leadframe by episulfide have contributed to these improvements.
Keywords
adhesives; copper; gold alloys; microassembling; nickel alloys; palladium alloys; silver; Ag; Cu; Ni-Pd-Au; adhesion property; die attach adhesion; dynamic curing; episulfide chemistry; episulfide materials; episulfide moieties; formulation testing; host resin system; interfacial adhesion; metal leadframe packages; surface analysis; universal die attach; Adhesives; Chemical elements; Chemistry; Electronics industry; Lead compounds; Materials testing; Microassembly; Semiconductor device packaging; Semiconductor materials; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Packaging Materials: Processes, Properties and Interfaces, 2005. Proceedings. International Symposium on
ISSN
1550-5723
Print_ISBN
0-7803-9085-7
Electronic_ISBN
1550-5723
Type
conf
DOI
10.1109/ISAPM.2005.1432049
Filename
1432049
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