DocumentCode :
3219939
Title :
Quantitative light emission as a probe of electrical treeing processes
Author :
Dodd, S.J. ; Champion, J.V. ; Stevens, G.C.
Author_Institution :
Dept. of Phys., City of London Polytech., UK
fYear :
1992
fDate :
22-25 Jun 1992
Firstpage :
308
Lastpage :
312
Abstract :
Light emission during the initiation and early growth stages of electrical treeing in CT200 epoxy and unsaturated polyester resins was studied quantitatively in order to gain insight into the underlying physical mechanisms responsible for tree initiation and growth. The data were also used to critically assess the field limited space charge (FLSC) model of T. Baumann et al. (1987) as well as the Schottky and Fowler-Nordheim charge injection mechanisms. Three distinct types of light emission are observed as the applied voltage is increased. The first is associated with initial charge injection with no resulting defects, the second with tree initiation, and the third with the existence of large channels. No threshold field/voltage is found for charge injection into the material. Some evidence is found for a material-dependent threshold for tree initiation from short-term step ramp tests. However, the results reveal that this is not a true threshold and that the stressing time is also important. This has implications for the influence of the tree initiation phase on the time-to-failure statistics in service
Keywords :
electric breakdown of solids; electroluminescence; luminescence of organic solids; organic insulating materials; polymers; CT200 epoxy; Fowler-Nordheim charge injection mechanisms; Schottky injection; electrical treeing processes; field limited space charge; initiation; material-dependent threshold; quantitative light emission; short-term step ramp tests; time-to-failure statistics; tree growth; unsaturated polyester resins; Dielectrics and electrical insulation; Electroluminescence; Geometry; Partial discharges; Polyethylene; Probes; Resins; Stress; Trees - insulation; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1992., Proceedings of the 4th International Conference on
Conference_Location :
Sestri Levante
Print_ISBN :
0-7803-0129-3
Type :
conf
DOI :
10.1109/ICSD.1992.224935
Filename :
224935
Link To Document :
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