Title :
Experimental studies of SAW and STW acceleration sensitivity
Author :
Huynh, D. ; McGowan, R. ; Kosinski, J.A. ; Stewart, J.T. ; Pierkarz, R. ; Mulford, C.D.
Author_Institution :
US Army LABCOM, Fort Monmouth, NJ, USA
fDate :
31 May-2 Jun 1995
Abstract :
Comparative studies of the normal acceleration sensitivities of 360 MHz SAW and STW two-port resonators have been performed. The resonators were fabricated on the same ST-cut wafer to insure the clearest comparison. The results show that the normal acceleration sensitivities of both types of devices can easily be improved one order magnitude by selecting the appropriate aspect-ratio of the device substrate and/or mounting system. Based on these results, the normal acceleration sensitivities of the STW resonators have been further improved through modifications to the existing resonators, resulting in normal acceleration sensitivity as low as 2.93×10-10/g. The measured values of the STW normal acceleration sensitivities are compared to that calculated for the case of simple supports along rectangular edges
Keywords :
acceleration; surface acoustic wave resonators; two-port networks; 360 MHz; SAW; ST-cut wafer; STW; acceleration sensitivity; aspect-ratio; device substrate; mounting system; two-port resonators; Acceleration; Acoustic transducers; Circuit testing; Fingers; Frequency; Gratings; Laboratories; Metallization; Oscillators; Surface acoustic waves;
Conference_Titel :
Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-2500-1
DOI :
10.1109/FREQ.1995.484044