• DocumentCode
    3220028
  • Title

    Semi-analytical finite element analysis of acceleration-induced frequency change in SAW resonators

  • Author

    Stewart, J.T. ; McGowan, R. ; Kosinski, J.A. ; Ballato, A.

  • Author_Institution
    US Army LABCOM, Fort Monmouth, NJ, USA
  • fYear
    1995
  • fDate
    31 May-2 Jun 1995
  • Firstpage
    499
  • Lastpage
    506
  • Abstract
    A quantitative analysis tool has been developed which determines the acceleration induced frequency change for surface acoustic waves (SAW) traveling in an arbitrary piezoelectric crystal resonator. This analysis tool uses a finite element approach to solve the static bias problem and Sinha and Tiersten´s analytical technique to determine the SAW mode shape. Combining this data with the spatially varying effective elastic constants, the numerical perturbation integral derived by Tiersten determines the acceleration sensitivity of the SAW resonator. The unique aspect of this software is the determination of the spatially varying effective elastic constants using finite element shape functions. The versatility of the tool will be demonstrated by modeling three mounting structures that have been experimentally verified. These mounting structures include two plane stress problems and a plane strain problem
  • Keywords
    acceleration; finite element analysis; surface acoustic wave resonators; SAW resonator; acceleration sensitivity; elastic constants; frequency shift; mode shape; mounting structures; numerical perturbation integral; piezoelectric crystal resonator; plane strain; plane stress; semi-analytical finite element analysis; software; static bias; surface acoustic waves; Acceleration; Acoustical engineering; Computer aided analysis; Design engineering; Equations; Finite element methods; Frequency; Shape; Surface acoustic wave devices; Surface acoustic waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-2500-1
  • Type

    conf

  • DOI
    10.1109/FREQ.1995.484045
  • Filename
    484045