DocumentCode
3220094
Title
Acceleration charge sensitivity in AT-quartz resonators
Author
Anderson, C.L. ; Bagby, J.S. ; Barrett, R.L. ; Ungvichian, V.
Author_Institution
Motorola Inc., Tempe, AZ, USA
fYear
1995
fDate
31 May-2 Jun 1995
Firstpage
519
Lastpage
529
Abstract
The behavior of AT-quartz resonators subject to acceleration is studied. For an AT-strip resonator with cantilever mounting, piezoelectric theory predicts that excitation of the pure lowest frequency flexural mode of vibration generates no charge. However, experiments show electromechanical resonance corresponding to this mode for sinusoidal support motion normal to the plane of the crystal with no applied electric field. An amplifier with a voltage follower first stage senses charge output from the crystal. Shielding is required to reduce sixty hertz and drive frequency electromagnetic interference. Measurement of resonant frequency and damping factor for the lowest frequency flexural mode is reported for a group of 17.76 MHz oscillator crystals. This mode is responsible for crystal breakage in some portable communications products. Significant variation in sensitivity among crystals was observed. Charge sensitivity of this mode is attributed in part to mechanical coupling to other modes involving torsion and lateral flexure
Keywords
acceleration; crystal resonators; quartz; 17.76 MHz; AT-strip quartz resonators; SiO2; acceleration charge sensitivity; amplifier; cantilever mounting; crystal breakage; crystal oscillators; damping factor; electromagnetic interference; electromechanical resonance; flexural modes; lateral flexure; mechanical coupling; piezoelectric theory; portable communications products; resonant frequency; shielding; torsion; vibrations; Acceleration; Crystals; Damping; Electromagnetic interference; Electromagnetic measurements; Frequency measurement; Resonance; Resonant frequency; Vibrations; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International
Conference_Location
San Francisco, CA
Print_ISBN
0-7803-2500-1
Type
conf
DOI
10.1109/FREQ.1995.484048
Filename
484048
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