Title :
On the compaction of test sets produced by genetic optimization
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
Abstract :
A previously proposed test generation procedure based on genetic optimization proved to have several advantages in terms of fault coverage; however, it produced large test set sizes. We investigate a way to generate compact test sets using this procedure by embedding it into a test compaction procedure. The compaction procedure constructs a compact test set out of the best tests contained in several test sets produced by the genetic optimization based test generation procedure. Using this approach, it is possible to significantly reduce the test set sizes obtained
Keywords :
automatic test equipment; fault diagnosis; genetic algorithms; iterative methods; embedding; fault coverage; genetic optimization; iterations; test generation; test set sizes; test sets compaction; Benchmark testing; Circuit faults; Circuit testing; Cities and towns; Compaction; Distributed power generation; Electrical fault detection; Fault detection; Genetic engineering; Tin;
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
Print_ISBN :
0-8186-8209-4
DOI :
10.1109/ATS.1997.643906