DocumentCode :
3220143
Title :
Sn2.5Ag0.5Cu lead free solder balls with "Ge" and "Ni"
Author :
Lee, Redwood ; Sin, Wha Soo ; Jeon, Jong Keun ; Kim, Heui Seog
Author_Institution :
Device Packaging Center, Samsung Electron. Ltd., Asan, South Korea
fYear :
2005
fDate :
16-18 March 2005
Firstpage :
121
Lastpage :
125
Abstract :
Recently, environmental-friendly products have significantly increased the development of lead free solder material. Some products are already in production and most of semiconductors will be released lead-freely. Among the various lead-free solders, the SnAgCu family of solders has been known as one of the leading candidates for high volume mass-production. However, SnAgCu still has a discoloration issue during ir-reflow and burn-in test, and the market requires stronger solder joint for fatigue bending and impact test due to the mobile electronics. In this paper, the countermeasure with adding "Ge" and "Ni" to prevent SnAgCu solder balls from discoloration is investigated and the optimization(3.0 → 2.5%) of the weight ratio of "Ag" contents to enhance solder joint for fatigue bending and impact test is studied and reliability test for the optimized Sn2.5Ag0.5Cu composition is investigated.
Keywords :
bending; copper alloys; germanium; impact testing; nickel; reliability; silver alloys; solders; tin alloys; Ge; Ni; SnAgCu; burn-in test; discoloration; environmental-friendly products; fatigue bending; high volume mass-production; impact testing; ir-reflow; lead free solder balls; mobile electronics; reliability test; solder joint; weight ratio; Consumer electronics; Electronic equipment testing; Environmentally friendly manufacturing techniques; Fatigue; High temperature superconductors; Impurities; Lead compounds; Mass production; Soldering; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Packaging Materials: Processes, Properties and Interfaces, 2005. Proceedings. International Symposium on
ISSN :
1550-5723
Print_ISBN :
0-7803-9085-7
Electronic_ISBN :
1550-5723
Type :
conf
DOI :
10.1109/ISAPM.2005.1432060
Filename :
1432060
Link To Document :
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