DocumentCode
3220166
Title
Poly(4,4´-diphenylene diphenylvinylene) Langmuir Blodgett thin films as a hole transport layer in polymer light emitting diode
Author
Mursyidah ; Salleh, M.M. ; Yahaya, M. ; Daik, R. ; Ooi, H.P.
Author_Institution
Sch. of Appl. Phys., Kebangsaan Malaysia Univ., Bangi, Malaysia
fYear
2000
fDate
2000
Firstpage
68
Lastpage
71
Abstract
Polymer based light emitting diodes (LED) are potentially useful in display technology. The basic structure of this device consists of a hole transport layer (p-type) and an electron transport layer (n-type). This paper reports a study on poly(4,4´-diphenylene diphenylvinylene) (PDPV) thin films for a hole transport layer in the device. The multilayer PDPV films were deposited on glass and ITO-covered glass substrates using the Langmuir Blodgett (LB) technique. Aluminum was deposited on the PDPV film as an electron injector and also as the electrode. The film was characterized by measuring the electrical properties, optical absorption and topography image. The sheet resistance of the PDPV film deposited on glass was (6.3±0.1)×108 Ω per square and the energy gap of the film was 2.95±0.01 eV. The performances of the devices with ITO/PDPV/Al structure were studied through the current-voltage curves measured in the dark. It was found that the device showed typical diode properties
Keywords
LED displays; Langmuir-Blodgett films; electric current; electric resistance; energy gap; hole mobility; light absorption; light emitting diodes; polymer films; surface topography; 2.94 to 2.96 eV; Al; Al electrode; Al electron injector; ITO; ITO-covered glass substrates; ITO/PDPV/Al structure; InSnO; Langmuir Blodgett technique; PDPV thin films; current-voltage curves; diode properties; display technology; electrical properties; electron transport layer; energy gap; glass substrates; hole transport layer; optical absorption; poly(4,4´-diphenylene diphenylvinylene) Langmuir Blodgett thin films; poly(4,4´-diphenylene diphenylvinylene) thin films; polymer LEDs; polymer light emitting diodes; sheet resistance; topography image; Charge carrier processes; Displays; Electrical resistance measurement; Glass; Light emitting diodes; Nonhomogeneous media; Optical films; Organic light emitting diodes; Polymer films; Thin film devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Electronics, 2000. Proceedings. ICSE 2000. IEEE International Conference on
Conference_Location
Guoman Port Dickson Resort
Print_ISBN
0-7803-6430-9
Type
conf
DOI
10.1109/SMELEC.2000.932327
Filename
932327
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