DocumentCode
3220307
Title
TEMPLATES: a test generation procedure for synchronous sequential circuits
Author
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
fYear
1997
fDate
17-19 Nov 1997
Firstpage
74
Lastpage
79
Abstract
We develop the basic definitions and procedures for a test generation concept referred to as templates that magnifies the effectiveness of test generation by taking advantage of the fact that many faults have “similar” test sequences. Once a template is generated, several test sequences to detect different faults are derived from it at a reduced complexity compared to the complexity of test generation
Keywords
automatic testing; finite state machines; logic testing; sequential circuits; software performance evaluation; complexity; effectiveness; finite state machines; synchronous sequential circuits; template; test generation; test sequences; Circuit faults; Circuit testing; Cities and towns; Electrical fault detection; Fault detection; Sequential analysis; Sequential circuits; Synchronous generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location
Akita
ISSN
1081-7735
Print_ISBN
0-8186-8209-4
Type
conf
DOI
10.1109/ATS.1997.643923
Filename
643923
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