Title :
Design and implementation of strongly code disjoint CMOS built-in intermediate voltage sensor for totally self-checking circuits
Author :
Pang, J.C.W. ; Wong, Mike W T ; Lee, Y.S.
Author_Institution :
Dept. of Electron. Eng., Hong Kong Polytech., Hung Hom, Hong Kong
Abstract :
This paper presents a new approach to implement a strongly code-disjoint CMOS built-in intermediate voltage sensor(BIVS). The function of the BIVS is used to detect any intermediate voltage caused by bridging and transistor stuck-on faults in the circuit. Detailed analyses of the proposed circuit have shown that the overall design not only can detect fault in the circuit under test, but also can detect or tolerate the fault in itself. An application example employing the BIVS as the output detection element to enhance the effectiveness of the totally selfchecking circuit is given
Keywords :
CMOS logic circuits; automatic testing; design for testability; electric sensing devices; voltage measurement; CMOS built-in intermediate voltage sensor; bridging; code disjoint CMOS sensor; current sensor; intermediate voltage; level shifter; self-checking circuits; switching network; transistor stuck-on faults; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic testing; Monitoring; Semiconductor device modeling; Voltage;
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
Print_ISBN :
0-8186-8209-4
DOI :
10.1109/ATS.1997.643925