Title :
On fault injection approaches for fault tolerance of feedforward neural networks
Author :
Ito, Takehiro ; Takanami, Itsuo
Author_Institution :
Dept. of Comput. Sci., Iwate Univ., Morioka, Japan
Abstract :
To make a neural network fault-tolerant, Tan et al. proposed a learning algorithm which injects intentionally the snapping of a wire one by one into a network (1992, 1992, 1993). This paper proposes a learning algorithm that injects intentionally stuck-at faults to neurons. Then by computer simulations, we investigate the recognition rate in terms of the number of snapping faults and reliabilities of lines and the learning cycle. The results show that our method is more efficient and useful than the method of Tan et al. Furthermore, we investigate the internal structure in terms of ditribution of correlations between input values of a output neuron for the respective learning methods and show that there is a significant difference of the distributions among the methods
Keywords :
digital simulation; fault location; fault tolerant computing; feedforward neural nets; learning (artificial intelligence); logic testing; multilayer perceptrons; computer simulation; ditribution of correlations; fault injection; fault tolerance; feedforward neural networks; internal structure; learning algorithm; learning cycle; learning methods; output neuron; recognition rate; reliabilities; snapping faults; stuck-at faults; Artificial neural networks; Fault tolerance; Feedforward neural networks; Indium tin oxide; Learning systems; Multi-layer neural network; Neural networks; Neurons; Signal processing algorithms; Wire;
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
Print_ISBN :
0-8186-8209-4
DOI :
10.1109/ATS.1997.643927