DocumentCode :
3220423
Title :
Analytical and Mechanical Methods for Material Property Investigations of SnAgCu-Solder
Author :
Petzold, M. ; Bennemann, S. ; Graff, A. ; Krause, M. ; Muller, M. ; Wiese, S. ; Wolter, K.-J.
Author_Institution :
Frajnhofer Inst. for Mech. of Mater., Halle
Volume :
1
fYear :
2006
fDate :
5-7 Sept. 2006
Firstpage :
376
Lastpage :
382
Abstract :
The development of lead-free solder materials with improved reliability properties requires a detailed understanding of the relationship between mechanical properties and microstructure. The paper presents methods that can be applied to characterize creep and plastic deformation behaviour and shows how currently available analytical methods for microstructure investigations can be used to track the physical origin of the observed mechanical behaviour. The paper specifically describes the advantages and use of mechanical and analytical tools, like nanoindentation, FIB, SEM, TEM and EDX in the field of solders for interconnects in electronic packaging
Keywords :
X-ray chemical analysis; copper alloys; creep; focused ion beam technology; materials testing; nanotechnology; plastic deformation; scanning electron microscopy; silver alloys; solders; tin alloys; transmission electron microscopy; SnAgCu; analytical methods; creep behaviour; electronic packaging interconnects; lead-free solder materials; material property investigations; mechanical methods; plastic deformation behaviour; Creep; Environmentally friendly manufacturing techniques; Grain size; Lead; Material properties; Materials testing; Mechanical factors; Microstructure; Stress; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Systemintegration Technology Conference, 2006. 1st
Conference_Location :
Dresden
Print_ISBN :
1-4244-0552-1
Electronic_ISBN :
1-4244-0553-x
Type :
conf
DOI :
10.1109/ESTC.2006.280029
Filename :
4060753
Link To Document :
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