Title :
ATREX: Design for testability system for Mega Gate LSIs
Author :
Emori, Michiaki ; Kumagai, Junko ; Itaya, Koichi ; Aikyo, Takashi ; Anan, Tomoko ; Niimi, Junichi
Author_Institution :
Fujitsu Labs. Ltd., Kawasaki, Japan
Abstract :
We propose a Design for Testability System for Mega Gate LSIs. This system meets various demands of designers, because this system has high flexibility. We show the flexibility by introducing some examples of circuit insertion which is supported by the system
Keywords :
automatic test software; automatic testing; design for testability; integrated logic circuits; large scale integration; logic design; logic gates; logic testing; ATREX; Mega Gate LSI; circuit insertion; design for testability; Circuit testing; Clocks; Design for testability; Design methodology; Flexible printed circuits; Large scale integration; Libraries; Logic circuits; Logic design; Pins;
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
Print_ISBN :
0-8186-8209-4
DOI :
10.1109/ATS.1997.643947
