DocumentCode
3220474
Title
Application of the MEBS SOURCE software package to high voltage electron gun design
Author
Munro, E. ; Zhu, Xinen ; Rouse, J.
Author_Institution
MEBS Ltd., London, UK
fYear
2004
fDate
27-29 April 2004
Firstpage
350
Lastpage
351
Abstract
We report on results of the high-voltage electron guns modeling with MEBS SOURCE software, where not only gun electron-optical properties, but high-voltage isolation have been analyzed and optimized successfully.
Keywords
electrical engineering computing; electron guns; electron optics; finite element analysis; software packages; MEBS SOURCE software package; SOURCEEF program; electron gun modeling; electron-optical properties; electrostatic potential distribution; high voltage electron gun design; high-voltage isolation; insulator E-field distribution; second-order finite element approach; triple-junction areas; Application software; Electron beams; Electron guns; Electron optics; Electrostatics; Insulation; Optical design; Software packages; Stimulated emission; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference, 2004. IVEC 2004. Fifth IEEE International
Print_ISBN
0-7803-8261-7
Type
conf
DOI
10.1109/IVELEC.2004.1316356
Filename
1316356
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