• DocumentCode
    3220578
  • Title

    The influence of space charge formation on polymer degradation investigated by means of PD

  • Author

    Neubert, Ralf

  • Author_Institution
    Inst. fuer Allgemeine Elektrotech. & Hochspannungstech., RWTH, Aachen, Germany
  • fYear
    1992
  • fDate
    22-25 Jun 1992
  • Firstpage
    133
  • Lastpage
    138
  • Abstract
    The partial-discharge (PD) measurement technique is used to study the effect of space charge formation, caused by injection and conduction mechanisms, on the degradation of low-density polyethylene. Besides the amplitude of the field strength, the duration of electrical stress plays an important role in the degradation process. Several electrochemical processes occurring under the influence of injected charges (oxidation, molecule cracking, and crosslinking) change the morphology of the polymer. Another time-dependent process (in the time scale of minutes) is the storage of stable space charges in deep traps. These mechanisms condition the polymer according to the history of stress, so that the inception of partial discharges is not purely field determined. These long-time effects are superimposed by conduction phenomena related to space charge movement. The results of the experiments indicate that PD measurements can give information about conduction and charge storage mechanisms in polymer insulating materials
  • Keywords
    electric breakdown of solids; organic insulating materials; oxidation; partial discharges; polymers; space charge; PD measurements; charge storage mechanisms; conduction mechanisms; crosslinking; deep traps; electrical treeing; electrochemical processes; injected charges; insulating materials; low-density polyethylene; molecule cracking; morphology; oxidation; partial-discharge; polymer degradation; space charge formation; space charge movement; time-dependent process; Electrochemical processes; Material storage; Measurement techniques; Oxidation; Partial discharges; Polyethylene; Polymers; Space charge; Stress; Thermal degradation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Solid Dielectrics, 1992., Proceedings of the 4th International Conference on
  • Conference_Location
    Sestri Levante
  • Print_ISBN
    0-7803-0129-3
  • Type

    conf

  • DOI
    10.1109/ICSD.1992.224976
  • Filename
    224976