Title :
A new diagnostic tool through computer simulation calculation using expanded partial discharge equivalent circuit
Author :
Alsheikhly, A. ; Guzman, H. ; Kranz, H.-G.
Author_Institution :
Lab. fuer Hochspannungstechnik Bergische, Univ. Wuppertal, Germany
Abstract :
An equivalent circuit has been developed to simulate PD (partial discharge) single activities in solid insulation. Attention is given to the simulation of the PD in afflicted solid electrical insulation between two metal electrodes. The aim is to simulate in real-time the effect of PD in the nanosecond region (microscopic period) and its effect on the consequent signals in the μs-region (macroscopical period) and the millisecond region. The simulation considers the nonlinearity of the discharge phenomena in the cavity as a voltage- and time-dependent resistance. The model also considers the measuring circuits, and takes into account the accumulation of charge at the dielectric electrodes of the cavity and in the area surrounding the footprints of the discharge. Analyzing the effect of each element of the circuit model, using circuit analysis, leads to much useful information and simplifies the explanation (from an engineering point of view) of the effect of the physics of the PD. This can be used as a basic diagnostic tool by observing the changes of the parameters due to deterioration
Keywords :
digital simulation; electronic engineering computing; equivalent circuits; insulation testing; partial discharges; cavity; circuit analysis; circuit model; computer simulation; diagnostic tool; dielectric electrodes; electrical insulation; equivalent circuit; metal electrodes; microsecond region; millisecond region; nanosecond region; partial discharge; real-time; solid insulation; time-dependent resistance; voltage-dependent resistance; Circuit simulation; Computational modeling; Computer simulation; Dielectrics and electrical insulation; Electrodes; Equivalent circuits; Microscopy; Partial discharges; Solid modeling; Voltage;
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1992., Proceedings of the 4th International Conference on
Conference_Location :
Sestri Levante
Print_ISBN :
0-7803-0129-3
DOI :
10.1109/ICSD.1992.224982