DocumentCode :
3220737
Title :
A new computer-aided measuring system for fundamental PD-studies
Author :
Kurrat, M. ; Schnettler, A.
Author_Institution :
Inst. of High Voltage Eng., Dortmund Univ., Germany
fYear :
1992
fDate :
22-25 Jun 1992
Firstpage :
166
Lastpage :
170
Abstract :
PD (partial discharge) monitoring in combination with time-resolved measurements is demonstrated to be a suitable tool for insulation diagnosis. Apart from statistical interpretations of phase-resolved PD patterns for fault recognition, description of material degradation and prediction of lifetime expectancy is desired. Time-resolved measurements yield information about physical processes within the insulation and can be used to explain the coherence between measured PD parameters, their statistical analysis, and the inner processes. PD quantities such as inception field strength, maximum apparent charge, and surface charge at the void walls are calculated and compared with experimental results. Numerical simulations of PD patterns for a void within polyethylene based upon these calculations are in good accordance with measured ones
Keywords :
automatic test equipment; computerised monitoring; fault location; insulation testing; partial discharges; PD monitoring; computer-aided measuring system; fault recognition; inception field strength; insulation diagnosis; lifetime expectancy; material degradation; maximum apparent charge; partial discharge; phase-resolved PD patterns; polyethylene; statistical analysis; surface charge; time-resolved measurements; void walls; Circuit testing; Current measurement; Cutoff frequency; Frequency measurement; Partial discharge measurement; Partial discharges; Pulse measurements; Time measurement; Voltage; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1992., Proceedings of the 4th International Conference on
Conference_Location :
Sestri Levante
Print_ISBN :
0-7803-0129-3
Type :
conf
DOI :
10.1109/ICSD.1992.224984
Filename :
224984
Link To Document :
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