• DocumentCode
    3220758
  • Title

    Mechanical fabrication of carbon nanotube films and their field-emission properties

  • Author

    Kai-Xuan He ; Juan Su ; Deng-Zhu Guo ; Ying-Jie Xing ; Geng-Min Zhang

  • Author_Institution
    Dept. of Electron., Peking Univ., Beijing, China
  • fYear
    2010
  • fDate
    14-16 Oct. 2010
  • Firstpage
    66
  • Lastpage
    66
  • Abstract
    Summary form only given. We present a simple technology for the fabrication of CNTs films cathode by utilizing method of rubbing CNT powders onto the polished substrates. The metallic substrates were polished by 10000 mesh white fused alumina powder at first. Then, the CNTs were rubbed on them. After that process, the metallic substrates were covered by CNTs films uniformly and firmly, as characterized by scanning electron microscope and scotch tape peeling tests. The field-electron-emission properties of such films cathodes were investigate under the vacuum of 10-5 Pa. The experimental results showed that the field-emission image of the films was nearly uniform and the emission current was considerably large. The turn-on field (the field at an emission current density of 10μA/cm ) was 3.4V/μm. The emission current density of 1.31mA/cm was obtained at the electric field of 6.1 V/μm, and emission current was almost stable in more than 60 minutes under about ImA/cm .
  • Keywords
    abrasion; carbon nanotubes; electron field emission; nanofabrication; polishing; powders; scanning electron microscopy; C; CNT powders; alumina powder; carbon nanotube films; emission current density; field electron emission properties; field-emission image; field-emission properties; mechanical fabrication; metallic substrate polishing; rubbing; scanning electron microscope; scotch tape peeling tests; turn-on field;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-6645-0
  • Type

    conf

  • DOI
    10.1109/IVESC.2010.5644422
  • Filename
    5644422