DocumentCode
3220802
Title
Nano-structure fabrication and manipulation by the cantilever oscillation of an atomic force microscope
Author
Hyon, C.K. ; Choi, S.C. ; Hwang, S.W. ; Ahn, D. ; Yong Kim ; Kim, E.K.
Author_Institution
Sch. of Electr. Eng., Korea Univ., Seoul, South Korea
fYear
1999
fDate
6-8 July 1999
Firstpage
50
Lastpage
51
Abstract
The authors report the direct fabrication and manipulation of nano-structures by using the cantilever oscillation of an atomic force microscope (AFM). The oscillating cantilever exerts a large enough force to break the surface bond and subsequently remove the atoms. Various reliable groove patterns on GaAs, with fully controlled width and depth, are achieved by adjusting the feedback gain of the AFM and the applied force. Furthermore, the selection and the subsequent removal of individual InAs self-assembled quantum dots is also shown to be possible.
Keywords
III-V semiconductors; atomic force microscopy; bonds (chemical); gallium arsenide; indium compounds; nanostructured materials; nanotechnology; self-assembly; semiconductor quantum dots; surface treatment; AFM; GaAs; GaAs-InAs; InAs self-assembled quantum dots; atomic force microscope; cantilever oscillation; feedback gain; groove patterns; manipulation; nano-structure fabrication; surface bond; Atomic force microscopy; Atomic layer deposition; Fabrication; Force control; Force feedback; Gallium arsenide; Information processing; Pattern formation; Quantum dots; Semiconductor materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocesses and Nanotechnology Conference, 1999. Digest of Papers. Microprocesses and Nanotechnology '99. 1999 International
Conference_Location
Yokohama, Japan
Print_ISBN
4-930813-97-2
Type
conf
DOI
10.1109/IMNC.1999.797471
Filename
797471
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