• DocumentCode
    3220802
  • Title

    Nano-structure fabrication and manipulation by the cantilever oscillation of an atomic force microscope

  • Author

    Hyon, C.K. ; Choi, S.C. ; Hwang, S.W. ; Ahn, D. ; Yong Kim ; Kim, E.K.

  • Author_Institution
    Sch. of Electr. Eng., Korea Univ., Seoul, South Korea
  • fYear
    1999
  • fDate
    6-8 July 1999
  • Firstpage
    50
  • Lastpage
    51
  • Abstract
    The authors report the direct fabrication and manipulation of nano-structures by using the cantilever oscillation of an atomic force microscope (AFM). The oscillating cantilever exerts a large enough force to break the surface bond and subsequently remove the atoms. Various reliable groove patterns on GaAs, with fully controlled width and depth, are achieved by adjusting the feedback gain of the AFM and the applied force. Furthermore, the selection and the subsequent removal of individual InAs self-assembled quantum dots is also shown to be possible.
  • Keywords
    III-V semiconductors; atomic force microscopy; bonds (chemical); gallium arsenide; indium compounds; nanostructured materials; nanotechnology; self-assembly; semiconductor quantum dots; surface treatment; AFM; GaAs; GaAs-InAs; InAs self-assembled quantum dots; atomic force microscope; cantilever oscillation; feedback gain; groove patterns; manipulation; nano-structure fabrication; surface bond; Atomic force microscopy; Atomic layer deposition; Fabrication; Force control; Force feedback; Gallium arsenide; Information processing; Pattern formation; Quantum dots; Semiconductor materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 1999. Digest of Papers. Microprocesses and Nanotechnology '99. 1999 International
  • Conference_Location
    Yokohama, Japan
  • Print_ISBN
    4-930813-97-2
  • Type

    conf

  • DOI
    10.1109/IMNC.1999.797471
  • Filename
    797471