• DocumentCode
    3220839
  • Title

    Design, fabrication, and reliability assessment of embedded resistors and capacitors on multilayered organic substrates

  • Author

    Lee, K.J. ; Bhattacharya, Swapan ; Varadarajan, Mahesh ; Wan, Lixi ; Abothu, Isaac Robin ; Sundaram, Venky ; Muthana, Prathap ; Balaraman, Devarajan ; Raj, P.M. ; Swaminathan, Madhavan ; Sitaraman, Suresh ; Tummala, Rao ; Viswanadham, Puligandla ; Dunford

  • Author_Institution
    Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2005
  • fDate
    16-18 March 2005
  • Firstpage
    249
  • Lastpage
    254
  • Abstract
    Embedded passives provide a practical solution to microelectronics miniaturization. In a typical circuit, over 80 percent of the electronic components are passives such as resistors, inductors, and capacitors that could take up to 50 percent of the entire printed circuit board area. By integrating passive components within the substrate, embedded passives reduce the system real estate, eliminate the need for discrete components and assembly of same, enhance electrical performance and reliability, and potentially reduce the overall cost. Moreover, it is lead free. Even with these advantages, embedded passive technology is at a relatively immature stage and more characterization and optimization are needed for practical applications leading to its commercialization. This paper presents an entire process from design and fabrication to electrical characterization and reliability test of embedded passives on multilayered microvia organic substrate. Two test vehicles focusing on resistors and capacitors have been designed and fabricated by Packaging Research Center (PRC) and Endicott Interconnect Technologies (EI). Resistors are carbon ink based polymer thick film (PTF) and NiCrAlSi, and capacitors are made with polymer/ceramic nanocomposite material. High frequency measurement of these capacitors was performed. Furthermore, reliability assessments of thermal shock and temperature humidity tests based on JED EC standards are presented.
  • Keywords
    aluminium alloys; barium compounds; ceramics; chromium alloys; circuit reliability; multilayers; nickel alloys; polymers; printed circuits; silicon alloys; thermal shock; thick film capacitors; thick film resistors; thin film capacitors; thin film resistors; titanium compounds; BaTiO3; NiCrAlSi; capacitors; embedded passives; inductors; microelectronics miniaturization; microvia organic substrate; nanocomposite material; polymer thick film; reliability; resistors; temperature humidity test; thermal shock test; Capacitors; Circuits; Electronic components; Fabrication; Inductors; Microelectronics; Polymer films; Resistors; Substrates; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties and Interfaces, 2005. Proceedings. International Symposium on
  • ISSN
    1550-5723
  • Print_ISBN
    0-7803-9085-7
  • Electronic_ISBN
    1550-5723
  • Type

    conf

  • DOI
    10.1109/ISAPM.2005.1432084
  • Filename
    1432084