Evolution of AC breakdown strength of XLPE HV cable after long term test and correlation with physical properties

Author

Bezille, J. ; Janah, H. ; Becker, J. ; Schädlich, H.

Author_Institution

Alcatel Cable, Calais, France

fYear

1992

fDate

22-25 Jun 1992

Firstpage

220

Lastpage

224

Abstract

A dry cured XLPE (cross-linked polyethylene) cable with 15 mm insulation thickness was aged for several years at 135 kV (corresponding to 13 kV/mm maximum stress) on site with load cycles. Electrical tests were carried out on unaged and aged cables. These cables were investigated in their radial direction by cutting thin films on a lathe. Some characteristics of aged insulation such as crystallinity, interfacial diffusion, bow-tie tree distribution, and AC breakdown strength were studied and compared with those of the unaged insulation. Radial breakdown strength obtained from thin films was compared with test results from cables. It was shown that ageing can have a very different influence on electrical characteristics along the radial axis of insulation due to competing factors such as crystallinity, mechanical stresses, and diffusion at semiconductive-shield insulation interfaces

Keywords

ageing; cable insulation; cable testing; electric breakdown of solids; insulation testing; organic insulating materials; polymers; power cables; self-diffusion in solids; semiconductor-insulator boundaries; shielding; 135 kV; 15 mm; AC breakdown strength; XLPE HV cable; aged insulation; bow-tie tree distribution; cross-linked polyethylene; crystallinity; dry cured; electrical characteristics; high voltage cable; insulation thickness; interfacial diffusion; long term test; mechanical stresses; physical properties; radial axis; semiconductive-shield insulation interfaces; unaged insulation; Aging; Cable insulation; Crystallization; Dielectrics and electrical insulation; Electric breakdown; Polyethylene; Power cable insulation; Power cables; Stress; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Conduction and Breakdown in Solid Dielectrics, 1992., Proceedings of the 4th International Conference on

Conference_Location

Sestri Levante

Print_ISBN

0-7803-0129-3

Type

conf

DOI

10.1109/ICSD.1992.224992

Filename

224992