DocumentCode
322089
Title
Computer Vision Algorithms For Pre-cap I.C. Inspection
Author
Wong, E.M.C. ; Koh, L.M. ; Heng, A.S. ; Tan, K.T.
Author_Institution
Nanyang Technological Institute
Volume
1
fYear
1988
fDate
24-28 Oct. 1988
Firstpage
217
Lastpage
222
Keywords
Assembly systems; Automation; Circuit testing; Computer vision; Image segmentation; Inspection; Integrated circuit technology; Integrated circuit testing; Visual databases; Welding;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics Society, 1988. IECON '88. Proceedings., 14 Annual Conference of
Conference_Location
Singapore
Type
conf
DOI
10.1109/IECON.1988.662371
Filename
662371
Link To Document