High current electron emission and injection in a gap with both vacuum and solid

Author

Chandra, W. ; Ang, L.K. ; Koh, W.S.

Author_Institution

Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore

fYear

2010

fDate

14-16 Oct. 2010

Firstpage

37

Lastpage

38

Abstract

A model to account for SCL current injection in a gap consists of both free space (vacuum) and solid dielectric is presented. The SCL electron current density J is solved numerically to obtain the voltage scaling of J~VGⁿ, and n is found to be between n=3/2 (vacuum gap) and n=2 (dielectric diode). The dependence of n is calculated as a function of dielectric constant, electron mobility, and the relative length scale between the free space and dielectric solid. The model has been used to explain a recent STM experiment.

Keywords

current density; dielectric materials; diodes; electron field emission; electron mobility; permittivity; space-charge-limited conduction; SCL current injection; SCL electron current density; STM experiment; dielectric constant; dielectric diode; dielectric solid; electron mobility; free space; high current electron emission; relative length scale; vacuum gap; voltage scaling; Solids;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International

Conference_Location

Nanjing

Print_ISBN

978-1-4244-6645-0

Type

conf

DOI

10.1109/IVESC.2010.5644431

Filename

5644431