• DocumentCode
    3221039
  • Title

    SPRES study on surface of barium tungsten cathodes coated with os film

  • Author

    Yin Sheng-yi ; Yang Jing-xin ; Zhang Hong-lai ; Wang Yu ; Wang Xin-Xin

  • Author_Institution
    Key Lab. of High Power Microwave Sources & Technol., Chinese Acad. of Sci., Beijing, China
  • fYear
    2010
  • fDate
    14-16 Oct. 2010
  • Firstpage
    19
  • Lastpage
    20
  • Abstract
    In order to study the characteristics of barium tungsten cathodes coated with Os film during activation, a photoelectron spectroscopy using synchrotron radiation (SPRES) at Beijing Synchrotron Radiation Laboratory is utilized. SPRES is a far more sensitive tool to determine surface composition than either XPS or AES. The cathode, manufactured by ourselves, has a stated impregnant composition of 6BaO/CaO/2Al2O3, a tungsten matrix porosity of 25-26%, and a sputter-deposited coating of Os approximately 0.35μm thick. The cathode is activated by heating according to A→B→C steps: A-step 950°C × 60 min, B-step 1050°C × 60 min, and C-step 1150°C × 60 min. The vacuum is kept below 1×10-8 Pa during measurements. The photon energies for SPRES collection are 700 eV and 900 eV, and scan step is 0.16 eV. All photoemission spectra are adjusted by adjusting the Pt4f of the Pt slice welded to the cathode holder surface as 71.20 eV.
  • Keywords
    barium compounds; cathodes; osmium; photoelectron spectra; photoemission; sputtered coatings; surface composition; synchrotron radiation; Ba-W-Os; Beijing Synchrotron Radiation Laboratory; Os film coating; Pt slice; Pt4f slice; SPRES; barium tungsten cathodes; cathode holder surface; photoelectron spectroscopy; photoemission spectra; photon energies; sputter deposition; surface composition; synchrotron radiation; tungsten matrix porosity; Barium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-6645-0
  • Type

    conf

  • DOI
    10.1109/IVESC.2010.5644436
  • Filename
    5644436