Breakdown strength of cross-linked polyethylene affected by semiconducting electrode interface condition

Author

Okamoto, Tatsuki ; Hozumi, Naohiro ; Ishida, Masayoshi ; Imajo, Takahisa

Author_Institution

Central Res. Inst. of Electr. Power Ind., Yokosuka, Japan

fYear

1992

fDate

22-25 Jun 1992

Firstpage

403

Lastpage

406

Abstract

Cable specimens with 3.5 mm insulation thickness made of different kinds of modified semiconducting materials were investigated in terms of the impulse breakdown strength and the lamella angle. Several specimens showed improvements in 50% and 1% Weibull breakdown strength. 50% Weibull breakdown strength was improved about 10% and 1% Weibul breakdown strength was improved by about 40%. The lamella angle, which is one of the parameters that characterizes the hyperstructure of XLPE (cross-linked polyethylene) insulation at the semiconducting interface in a cable specimen, was considered. A strong correlation between the breakdown strength of XLPE power cables and the lamella angle was found

Keywords

cable insulation; electric breakdown of solids; electric strength; electrodes; organic insulating materials; polymers; power cables; semiconductor-insulator boundaries; 3.5 mm; Weibull breakdown strength; XLPE; cross-linked polyethylene; hyperstructure; impulse breakdown strength; insulation; lamella angle; modified semiconducting materials; power cables; semiconducting electrode interface; Additives; Cable insulation; Electric breakdown; Electrodes; Plastic insulation; Polyethylene; Polymers; Power cables; Semiconductivity; Semiconductor device breakdown;

fLanguage

English

Publisher

ieee

Conference_Titel

Conduction and Breakdown in Solid Dielectrics, 1992., Proceedings of the 4th International Conference on

Conference_Location

Sestri Levante

Print_ISBN

0-7803-0129-3

Type

conf

DOI

10.1109/ICSD.1992.225001

Filename

225001