• DocumentCode
    3221375
  • Title

    Breakdown statistics for XLPE containing the volatile by-products of the cross-linking reaction

  • Author

    Damon, Dwight H.

  • Author_Institution
    Electr. Insulation Res. Center, Connecticut Univ., Storrs, CT, USA
  • fYear
    1992
  • fDate
    22-25 Jun 1992
  • Firstpage
    513
  • Lastpage
    517
  • Abstract
    AC and impulse breakdown strengths have been measured on recessed samples of cross-linked polyethylene (XLPE) containing controlled amounts of the by-products (or residues) of the crosslinking reaction, i.e. acetophenone, cumyl alcohol, alpha methyl styrene, and cumene. The statistics used to describe the distribution of breakdown strengths are discussed. Weibull, Gumbel, and Gaussian statistics are compared. Other statistical distributions resulting from fluctuations in the character of the discharge sites at the metal-polymer interface are also examined. Despite the fact that a simple weakest link mechanism cannot be used to describe the breakdown strengths of recessed samples of XLPE containing the crosslinking residues, no reason has been found to discard the Weibull distribution. The results of this investigation can therefore be presented in tables of characteristics values and shape parameters
  • Keywords
    cable insulation; electric breakdown of solids; electric strength; impulse testing; insulation testing; organic insulating materials; polymers; statistical analysis; AC breakdown; Gaussian statistics; Gumbel statistics; Weibull distribution; XLPE; acetophenone; alpha methyl styrene; cross-linking reaction; cumene; cumyl alcohol; discharge sites; distribution of breakdown strengths; impulse breakdown strengths; metal-polymer interface; recessed samples; volatile by-products; Compression molding; Data analysis; Electric breakdown; Fluctuations; Measurement standards; Polyethylene; Shape measurement; Statistical distributions; Statistics; Weibull distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Solid Dielectrics, 1992., Proceedings of the 4th International Conference on
  • Conference_Location
    Sestri Levante
  • Print_ISBN
    0-7803-0129-3
  • Type

    conf

  • DOI
    10.1109/ICSD.1992.225019
  • Filename
    225019