DocumentCode
3221385
Title
Built-in current sensor designs based on the bulk-driven technique
Author
Huang, Tsung-Chu ; Huang, Min-Cheng ; Lee, Muen-Jong
Author_Institution
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
fYear
1997
fDate
17-19 Nov 1997
Firstpage
384
Lastpage
389
Abstract
Recently the bulk-driven current mirror technique has been employed in built-in current sensors for low voltage environment. This paper proposes 4 arrangements of built-in current sensors based on this technique. They are mainly different in biasing schemes end respectively take the advantages of simplicity, accuracy, flexibility and low power dissipation. From experiments, these sensors have small performance impact which causes only 0.3 V of power supply voltage drop and 0.3 ns delay of circuit speed degradation. These sensors require single external power supply and small area overhead
Keywords
CMOS integrated circuits; SPICE; built-in self test; electric current measurement; electric sensing devices; integrated circuit measurement; 0.3 V; 0.3 ns; IDDQ testing; accuracy; area overhead; biasing schemes; built-in current sensor; bulk-driven current mirror; circuit speed degradation; external power supply; flexibility; low power dissipation; power supply voltage drop; simplicity; Circuit testing; Costs; Degradation; Delay; Low voltage; Mirrors; Monitoring; Power dissipation; Power supplies; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location
Akita
ISSN
1081-7735
Print_ISBN
0-8186-8209-4
Type
conf
DOI
10.1109/ATS.1997.643987
Filename
643987
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