• DocumentCode
    3221385
  • Title

    Built-in current sensor designs based on the bulk-driven technique

  • Author

    Huang, Tsung-Chu ; Huang, Min-Cheng ; Lee, Muen-Jong

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • fYear
    1997
  • fDate
    17-19 Nov 1997
  • Firstpage
    384
  • Lastpage
    389
  • Abstract
    Recently the bulk-driven current mirror technique has been employed in built-in current sensors for low voltage environment. This paper proposes 4 arrangements of built-in current sensors based on this technique. They are mainly different in biasing schemes end respectively take the advantages of simplicity, accuracy, flexibility and low power dissipation. From experiments, these sensors have small performance impact which causes only 0.3 V of power supply voltage drop and 0.3 ns delay of circuit speed degradation. These sensors require single external power supply and small area overhead
  • Keywords
    CMOS integrated circuits; SPICE; built-in self test; electric current measurement; electric sensing devices; integrated circuit measurement; 0.3 V; 0.3 ns; IDDQ testing; accuracy; area overhead; biasing schemes; built-in current sensor; bulk-driven current mirror; circuit speed degradation; external power supply; flexibility; low power dissipation; power supply voltage drop; simplicity; Circuit testing; Costs; Degradation; Delay; Low voltage; Mirrors; Monitoring; Power dissipation; Power supplies; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
  • Conference_Location
    Akita
  • ISSN
    1081-7735
  • Print_ISBN
    0-8186-8209-4
  • Type

    conf

  • DOI
    10.1109/ATS.1997.643987
  • Filename
    643987