Low cost BIST for EDAC circuits

An application of new idea of designing circular self-test path (CSTP) for EDAC circuit is given in the paper. The new BIST scheme called in the paper as a condensed circular self-test path (CCSTP=C²STP) makes possible to reduce significantly the number of CBIST cells to a smaller value. We focus on the analysis of the state transition graph (STG) as a key to understand the state coverage, fault coverage, and zero aliasing of condensed circular BIST (CBIST) schemes. There are given two examples of C²BIST design. Particularly, the simple example of C²STP design for 4-bit errors detection and errors correction (EDAC) circuit indicates advantages of such BIST technique. On the basis of this example it is shown that the time and complexity of simulation process for C² STP is smaller than those for CSTP configuration and the seek time of a solution giving quasi optimal effectiveness for C²STP is considerably shorter