DocumentCode
3221723
Title
Thermal Fatigue Life Evaluation of Aluminum Wire Bonds
Author
Matsunaga, Toshihiro ; Uegai, Yasumi
Author_Institution
Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Hyogo
Volume
2
fYear
2006
fDate
5-7 Sept. 2006
Firstpage
726
Lastpage
731
Abstract
For a reliability design, it is necessary to evaluate of the effects of thermal fatigue on Al wire bond´s lifetime quantitatively due to the repetitive turning on and off a high current on a semiconductor power module. In this paper, we investigate the relationships among the thermal cycling temperature swing range DeltaT, the thermal cycling period, the maximum junction temperature Tmax, and number of cycles to failure N/using a fast thermal cycling test method we developed. Furthermore, with the aim of predicting the power cycling lifetime, we examined whether the cumulative fatigue damage law can be applied to evaluation of wire bond lifetime
Keywords
aluminium; lead bonding; life testing; thermal stress cracking; Al; aluminum wire bonds; fatigue damage law; life evaluation; power cycling lifetime; reliability design; thermal cycling temperature; thermal cycling test; thermal fatigue; wire bond lifetime; Aluminum; Bonding; Fatigue; Heat sinks; Life testing; Multichip modules; Temperature distribution; Thermal loading; Thermal stresses; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Systemintegration Technology Conference, 2006. 1st
Conference_Location
Dresden
Print_ISBN
1-4244-0552-1
Electronic_ISBN
1-4244-0553-x
Type
conf
DOI
10.1109/ESTC.2006.280092
Filename
4060817
Link To Document