• DocumentCode
    3221723
  • Title

    Thermal Fatigue Life Evaluation of Aluminum Wire Bonds

  • Author

    Matsunaga, Toshihiro ; Uegai, Yasumi

  • Author_Institution
    Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Hyogo
  • Volume
    2
  • fYear
    2006
  • fDate
    5-7 Sept. 2006
  • Firstpage
    726
  • Lastpage
    731
  • Abstract
    For a reliability design, it is necessary to evaluate of the effects of thermal fatigue on Al wire bond´s lifetime quantitatively due to the repetitive turning on and off a high current on a semiconductor power module. In this paper, we investigate the relationships among the thermal cycling temperature swing range DeltaT, the thermal cycling period, the maximum junction temperature Tmax, and number of cycles to failure N/using a fast thermal cycling test method we developed. Furthermore, with the aim of predicting the power cycling lifetime, we examined whether the cumulative fatigue damage law can be applied to evaluation of wire bond lifetime
  • Keywords
    aluminium; lead bonding; life testing; thermal stress cracking; Al; aluminum wire bonds; fatigue damage law; life evaluation; power cycling lifetime; reliability design; thermal cycling temperature; thermal cycling test; thermal fatigue; wire bond lifetime; Aluminum; Bonding; Fatigue; Heat sinks; Life testing; Multichip modules; Temperature distribution; Thermal loading; Thermal stresses; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Systemintegration Technology Conference, 2006. 1st
  • Conference_Location
    Dresden
  • Print_ISBN
    1-4244-0552-1
  • Electronic_ISBN
    1-4244-0553-x
  • Type

    conf

  • DOI
    10.1109/ESTC.2006.280092
  • Filename
    4060817