• DocumentCode
    3221737
  • Title

    Dependence of frequency-temperature characteristics of quartz resonators on form, dimensions and local variations of thickness of piezoelectric crystal

  • Author

    Postnikov, I.I.

  • Author_Institution
    Moscow Power Eng. Inst., Russia
  • fYear
    1995
  • fDate
    31 May-2 Jun 1995
  • Firstpage
    804
  • Lastpage
    809
  • Abstract
    An algorithm and computing program for solving a boundary-value problem are developed to determine temperature dependencies of eigenvalues and eigenfunctions of quartz resonators with rotated Y-cut piezoelectric crystals with axial symmetry and varying thickness. The possibility of determining of these dependencies is demonstrated for crystals with varying thickness and different cut directions for both harmonic and nonharmonic vibrations
  • Keywords
    boundary-value problems; crystal resonators; eigenvalues and eigenfunctions; harmonic oscillators (circuits); quartz; SiO2; axial symmetry; boundary-value problem; cut directions; eigenfunctions; eigenvalues; frequency-temperature characteristics; harmonic vibrations; local thickness variations; nonharmonic vibrations; piezoelectric crystal; quartz resonators; rotated Y-cut; temperature dependencies; Crystals; Elasticity; Lab-on-a-chip; Power engineering; Power engineering computing; Resonance; Resonant frequency; Temperature dependence; Temperature distribution; Vibration measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-2500-1
  • Type

    conf

  • DOI
    10.1109/FREQ.1995.484088
  • Filename
    484088