• DocumentCode
    3221742
  • Title

    Test Methods for Characterizing the Local Plastic Deformability of Bonding Wires

  • Author

    Dresbach, C. ; Knoll, H. ; Schischka, J. ; Petzold, M. ; Hosseini, K. ; Schrapler, L.

  • Author_Institution
    Fraunhofer Inst. for Mech. of Mater., Halle
  • Volume
    2
  • fYear
    2006
  • fDate
    5-7 Sept. 2006
  • Firstpage
    732
  • Lastpage
    740
  • Abstract
    Different methods for characterizing the local plastic deformability of small Al bonding wire samples were presented including Vickers and spherical indentation as well as micro compression testing for two different sample orientations. The results were compared to reference data derived from tensile testing of macroscopic wire specimens and to the Al grain microstructure as characterized by the electron backscatter diffraction (EBSD) method. A close correlation between tensile wire strength, hardness data and grain size was found. This relationship can be used to evaluate local changes in the wire material properties due to the influence of process steps or application conditions. In addition, the potential and high accuracy of the newly developed micro compression test was demonstrated. Stress-strain curves derived from micro compression testing agreed well with the reference data in most cases. In so far, the micro compression test can be used as a tool to quantify the local mechanical behaviour of processed bonding wires and bonded interconnects
  • Keywords
    Vickers hardness; aluminium; lead bonding; materials properties; plastic deformation; stress-strain relations; tensile testing; Al; Vickers indentation; bonding wires; electron backscatter diffraction; macroscopic wire specimens; material properties; micro compression testing; plastic deformability; spherical indentation; stress strain curves; tensile testing; test methods; Backscatter; Bonding; Diffraction; Electrons; Grain size; Material properties; Microstructure; Plastics; Testing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Systemintegration Technology Conference, 2006. 1st
  • Conference_Location
    Dresden
  • Print_ISBN
    1-4244-0552-1
  • Electronic_ISBN
    1-4244-0553-x
  • Type

    conf

  • DOI
    10.1109/ESTC.2006.280093
  • Filename
    4060818