DocumentCode
3221818
Title
Overview of Hyperion on-orbit instrument performance, stability, and artifacts
Author
Beiso, D.
Author_Institution
Electro-Opt. Products Dept., TRW, Redondo Beach, CA, USA
fYear
2002
fDate
16-17 Oct. 2002
Firstpage
95
Lastpage
101
Abstract
Hyperion, one of three payloads on the Earth-Observing 1 (EO-1) spacecraft that was launched from Vandenberg Air Force Base on November 21, 2000, is a hyperspectral imager built by TRW Space & Electronics for NASA´s Goddard Space Flight Center. EO-1 is part of NASA´s New Millennium Program whose goal is to demonstrate advanced technologies for reducing cost and improving quality of instruments and spacecraft for future space missions. Under this program, missions are intended primarily to validate new technologies in-flight and to provide useful data to the scientific research community. The first four months of mission life were focused on instrument activation, functional checkout, and performance verification. This paper presents an overview of the Hyperion instrument, summarize the on-orbit performance verification and validation activities, and describe known instrument artifacts.
Keywords
Earth orbit; aerospace instrumentation; aerospace testing; calibration; geophysical techniques; remote sensing; space vehicles; stability; EO-1 spacecraft; Earth-Observing 1 spacecraft; Hyperion instrument; Hyperion on-orbit instrument performance; NASA Goddard Space Flight Center; NASA New Millennium Program; TRW Space & Electronics; Vandenberg Air Force Base; cost reduction; hyperspectral imager; instrument activation; instrument artifacts; instrument functional checkout; instrument performance verification; on-orbit instrument stability; on-orbit performance validation; on-orbit performance verification; on-orbit spectral calibration; scientific research community; space missions; Assembly; Earth; Hyperspectral imaging; Hyperspectral sensors; Instruments; Radiometry; Space technology; Space vehicles; Spatial resolution; Stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Imagery Pattern Recognition Workshop, 2002. Proceedings. 31st
Print_ISBN
0-7695-1863-X
Type
conf
DOI
10.1109/AIPR.2002.1182260
Filename
1182260
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