DocumentCode
3222161
Title
Am/IDG-FET based reconfigurable cells versus LUTs: Characteristics description and analysis
Author
Cheng, K. ; Le Beux, Sebastien ; O´Connor, Ian
Author_Institution
Inst. des Nanotechnol. de Lyon (INL), Ecole Centrale de Lyon (ECL), Lyon, France
fYear
2013
fDate
15-18 Dec. 2013
Firstpage
1
Lastpage
4
Abstract
Ambipolar and/or Independent Double Gate-FET (Am/IDG-FET) technology offers the possibility to optimize the architecture of reconfigurable cells at transistor level. Many of such reconfigurable cells have been proposed offering different partial functionality set, and previous work shows the benefit of such designs in terms of electric performance. This paper analyzes the benefits and drawbacks of Reconfigurable Cells based on Am/IDG-FETs versus commonly used 2, 4, and 6-inputs LUTs considering the number of transistor and the number of input. Results show the drastic optimization (Reduction of 30% to 50% of the transistor count) but at the cost of a reduce set of function at the cell level. As main FPGA manufacturer proved that a 6-inputs LUTs is the best solutions in terms of input granularity, 6-inputs Am/IDG-FET based Reconfigurable cells represent a considerable optimized solution.
Keywords
field effect transistors; field programmable gate arrays; FPGA; LUT; ambipolar FET; independent double gate-FET; input granularity; partial functionality set; reconfigurable cells; Bismuth; Multiplexing; Nanoscale devices; SRAM cells; Table lookup; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics (ICM), 2013 25th International Conference on
Conference_Location
Beirut
Print_ISBN
978-1-4799-3569-7
Type
conf
DOI
10.1109/ICM.2013.6734987
Filename
6734987
Link To Document