Title :
Sharp disparity reconstruction using sparse disparity measurement and color information
Author :
Lee-Kang Liu ; Zucheul Lee ; Nguyen, Thin
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, La Jolla, CA, USA
Abstract :
Recently, the work on dense disparity map reconstruction from 5% sparse initial estimates containing edges in disparity, has been proposed [1]. Practically, however, edges in disparity is unknown unless a dense disparity map has already been generated. In this paper, we present a realistic reconstruction framework for obtaining sharp and dense disparity maps from fixed number of sparse initial estimates with the aid of color image information. Experimental results show that sharp and dense disparity maps can be reconstructed at the cost of one pixel accuracy.
Keywords :
edge detection; image colour analysis; image reconstruction; color image information; color information; dense disparity map reconstruction; edge detection; sharp disparity reconstruction; sparse disparity measurement; Accuracy; Color; Estimation; Image color analysis; Image edge detection; Image reconstruction; Semiconductor device measurement; Compressive Sensing; Disparity; Edge Detection; Sparse Reconstruction; Sparsity;
Conference_Titel :
IVMSP Workshop, 2013 IEEE 11th
Conference_Location :
Seoul
DOI :
10.1109/IVMSPW.2013.6611899