• DocumentCode
    3223569
  • Title

    Dual cycle shift data-weighted averaging technique for multi-bit Sigma-Delta Modulators

  • Author

    Ma, Xiaofen ; Xu, Jian ; Xiaobo Wu

  • Author_Institution
    Inst. of VLSI Design, Zhejiang Univ., Hangzhou, China
  • fYear
    2009
  • fDate
    25-27 Dec. 2009
  • Firstpage
    174
  • Lastpage
    177
  • Abstract
    Data weighted averaging (DWA) is the most popular dynamic element matching (DEM) technique to reduce the effects of DAC nonlinearity in multi-bit sigma-delta modulators (MBSDM). However, due to the non-symmetry of the unit-elements in multi-bit DAC, in-band signal-dependent tones always appear when a low oversampling ratio (OSR) is employed in traditional DWA. Therefore, a novel DEM technique, dual cycle shift DWA (DCSDWA), is proposed to deal with the tone problem in this paper. Compared with other modified DWA techniques, DCSDWA is a more effective one with simple implementation. Using the proposed technique in a 4th-order MBSDM with an OSR of 32, the maximum in-band tone is reduced to 6 dB when a random DAC-element mismatching error of 0.5% is assumed. In addition, it results in a better linearity of signal-to-noise distortion ratio (SNDR) versus different input signal and a wider dynamic range (DR). The simulation results prove that the proposed DCSDWA is suitable for low OSR applications (OSR¿8) with a good performance.
  • Keywords
    sigma-delta modulation; dual cycle shift data-weighted averaging technique; dynamic element matching technique; in-band signal-dependent tones; low oversampling ratio; multibit sigma-delta modulators; signal-to-noise distortion ratio; Calibration; Clocks; Counting circuits; Delta-sigma modulation; Distortion; Dynamic range; Feedback; Linearity; Mathematical model; Signal processing; DAC nonlinearity; Dual Cycle Shift DWA; Multi-bit Sigma-Delta modulators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits, 2009. EDSSC 2009. IEEE International Conference of
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-4297-3
  • Electronic_ISBN
    978-1-4244-4298-0
  • Type

    conf

  • DOI
    10.1109/EDSSC.2009.5394163
  • Filename
    5394163