Digital static calibration technology used for 400MSPS, 16-bit DAC

Author

Dongmei, Zhu ; Dongbing, Fu ; Jiangang, Shi ; Kaicheng, Li

Author_Institution

Nat. Labs. of Analog Integrated Circuits, Sichuan Inst. of Solid-state Circuits, Chongqing, China

fYear

2009

fDate

25-27 Dec. 2009

Firstpage

91

Lastpage

94

Abstract

In this study, the digital static calibration technique used for 400MSPS, 16-bit high-resolution current steering DAC is described. The technique uses address generator, comparator, SAR register, and calibration DAC to comprise successive approximation calibration loop. With the calibration loop, the respective calibration of array units of current source can be implemented automatically one by one, thus improving greatly matchable performance of current source. The differential nonlinearity error of 16-bit current steering DAC with the calibration technology reaches a true 16-bit relative static resolution with DNL<Â±0.5LSB.

Keywords

calibration; constant current sources; digital-analogue conversion; 16-bit high-resolution current steering DAC; 400MSPS; SAR register; address generator; calibration DAC; calibration loop; comparator; differential nonlinearity error; digital static calibration technology; digital-to-analog converter; Analog integrated circuits; Calibration; Equations; Frequency domain analysis; Fuses; MOSFETs; Manufacturing processes; Signal resolution; Solid state circuits; Testing; DC resolution; DNL; SAR; current steering DAC; digital static calibration; mismatch;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices and Solid-State Circuits, 2009. EDSSC 2009. IEEE International Conference of

Conference_Location

Xi´an

Print_ISBN

978-1-4244-4297-3

Electronic_ISBN

978-1-4244-4298-0

Type

conf

DOI

10.1109/EDSSC.2009.5394183

Filename

5394183